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You're reading from  Data Acquisition Using LabVIEW

Product typeBook
Published inDec 2016
PublisherPackt
ISBN-139781782172161
Edition1st Edition
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Author (1)
Yik Yang
Yik Yang
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Yik Yang

Yik Yang  is a test engineer living in Chicago who has specialized in automation and data analysis. Having worked in multiple fields such as semiconductor, automotive, and power, he has experience with different types of automation and understands what are the industries' needs.He started his career after receiving his Bachelor's and Master's degrees in Electrical Engineering at Virginia Tech. In his career, he worked on automation projects that used CompactDAQ, PXI, FPGA, and so on in LabVIEW. He has also spent a lot of time with Lean Six Sigma and statistical analysis with JMP. He is a certified Professional Engineer (PE) in North Carolina and a Certified LabVIEW Developer (CLD).
Read more about Yik Yang

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Debugging - broken arrow


As mentioned previously, when a VI is "seriously!" broken, it does not run and a broken arrow is displayed. Since the error is immediately recognized by LabVIEW, usually in such particular cases, the fix is probably simple (unless a major design error is recognized). A more difficult situation maybe where there are no obvious errors, but the VI does not do what we intend it to do. We will now take a closer look at a version of a VI we used in Chapter 4, DAQ Programming Using LabVIEW:

When we run the preceding VI several times, we will notice a couple of issues with the VI. Note that a displayed array may be extended horizontally or vertically:

  • The array gets longer and longer and new values are appended to the end of the results from the previous run

  • There are blank array elements between the array entries (this was an error with the logic of the VI and we fixed it by adding a check for blank array elements)

To fix the issue, we know that we need to initialize the...

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Data Acquisition Using LabVIEW
Published in: Dec 2016Publisher: PacktISBN-13: 9781782172161

Author (1)

author image
Yik Yang

Yik Yang  is a test engineer living in Chicago who has specialized in automation and data analysis. Having worked in multiple fields such as semiconductor, automotive, and power, he has experience with different types of automation and understands what are the industries' needs.He started his career after receiving his Bachelor's and Master's degrees in Electrical Engineering at Virginia Tech. In his career, he worked on automation projects that used CompactDAQ, PXI, FPGA, and so on in LabVIEW. He has also spent a lot of time with Lean Six Sigma and statistical analysis with JMP. He is a certified Professional Engineer (PE) in North Carolina and a Certified LabVIEW Developer (CLD).
Read more about Yik Yang