Reader small image

You're reading from  Data Acquisition Using LabVIEW

Product typeBook
Published inDec 2016
PublisherPackt
ISBN-139781782172161
Edition1st Edition
Right arrow
Author (1)
Yik Yang
Yik Yang
author image
Yik Yang

Yik Yang  is a test engineer living in Chicago who has specialized in automation and data analysis. Having worked in multiple fields such as semiconductor, automotive, and power, he has experience with different types of automation and understands what are the industries' needs.He started his career after receiving his Bachelor's and Master's degrees in Electrical Engineering at Virginia Tech. In his career, he worked on automation projects that used CompactDAQ, PXI, FPGA, and so on in LabVIEW. He has also spent a lot of time with Lean Six Sigma and statistical analysis with JMP. He is a certified Professional Engineer (PE) in North Carolina and a Certified LabVIEW Developer (CLD).
Read more about Yik Yang

Right arrow

DAQ devices versus microcontrollers


It is now almost over a decade and a half since microcontrollers have no longer been limited to digital I/Os. Mixed signals, control bus memory, separate timers, and counters have pushed their way into traditional microcontrollers with a speed that is only limited by the die size and functionality required, and most certainly price.

It is an undisputable fact that in data acquisition, speed and accuracy are directly related to the actual hardware and processors used and, depending on the speed and accuracy intended, a user must use proper hardware/software. In other words, proper instrumentation is the key to meaningful Data Acquisition. However, speed and accuracy at any given time in history have been relative terms. The terms high speed and accuracy have been highly relative throughout recent years and what we mean by speed and accuracy today is far different from what they meant just a few years ago.

lock icon
The rest of the page is locked
Previous PageNext Page
You have been reading a chapter from
Data Acquisition Using LabVIEW
Published in: Dec 2016Publisher: PacktISBN-13: 9781782172161

Author (1)

author image
Yik Yang

Yik Yang  is a test engineer living in Chicago who has specialized in automation and data analysis. Having worked in multiple fields such as semiconductor, automotive, and power, he has experience with different types of automation and understands what are the industries' needs.He started his career after receiving his Bachelor's and Master's degrees in Electrical Engineering at Virginia Tech. In his career, he worked on automation projects that used CompactDAQ, PXI, FPGA, and so on in LabVIEW. He has also spent a lot of time with Lean Six Sigma and statistical analysis with JMP. He is a certified Professional Engineer (PE) in North Carolina and a Certified LabVIEW Developer (CLD).
Read more about Yik Yang